Englisch
Lab services using XPS, AES and TOF-SIMS surface analysis methods
Application of surface analysis methods for industrial problem solving. The combination of the methods magnifies the achieved results.
Themen: Analytik, Applikationen
Veranstaltungstyp: Vortrag
01.01.1970
01:00 (30 Minuten)
Halle B1.141
Dr. Andrey Lyapin
Application scientist